서지주요정보
Nanometer technology designs high-quality delay tests / [electronic resource]
서명 / 저자 Nanometer technology designs [electronic resource] : high-quality delay tests / by Mohammad Tehranipoor, Nisar Ahmed.
저자명 Ahmed, Nisar.;Tehranipoor, Mohammad.
단체명 Ahmed, Nisar.;Tehranipoor, Mohammad.
발행사항 Boston, MA : Springer US, 2008.
Online Access http://dx.doi.org/10.1007/978-0-387-75728-5URL

서지기타정보

서지기타정보
청구기호 TK7874 .T261 2008
형태사항 xvii, 281 p. : ill., digital ; 24 cm.
언어 English
주제 Nanoelectronics.
Integrated circuits --Testing.
Integrated circuits --Very large scale integration.
Engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Computer-Aided Engineering (CAD, CAE) and Design.
Nanotechnology.
Electrical Engineering.
보유판 및 특별호 저록 Springer eBooks
ISBN 9780387757285 (electronic bk.) 9780387764863 (paper)
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