| 서명 / 저자 |
Beam effects, surface topography, and depth profiling in surface analysis [electronic resource] / edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell.
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| 저자명 |
Czanderna, Alvin Warren;Madey, Theodore E.;Powell, C. J |
| 단체명 |
Czanderna, Alvin Warren;Madey, Theodore E.;Powell, C. J |
| 발행사항 |
New York : Kluwer Academic, c2002.
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| 총서명 |
Methods of surface characterization ; v. 5
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| Online Access |
http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=67545URL
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