청구기호 |
TK7871.99 .S121d 2007 |
형태사항 |
xxi, 328 p. : ill. ; 24 cm.
|
언어 |
English |
일반주기 |
New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998.
|
서지주기 |
Includes bibliographical references and index.
|
주제 |
Metal oxide semiconductors, Complementary --Testing.
Metal oxide semiconductors, Complementary --Defects.
Integrated circuits --Very large scale integration --Testing.
Integrated circuits --Very large scale integration --Defects.
|
ISBN |
9780387465463 (hd.bd.)
0387465464: |