서지주요정보
Pulsed-laser induced graphitization of single crystal silicon carbide = 펄스 레이저를 이용한 단결정 탄화규소 표면 위 그래핀 성장 연구
서명 / 저자 Pulsed-laser induced graphitization of single crystal silicon carbide = 펄스 레이저를 이용한 단결정 탄화규소 표면 위 그래핀 성장 연구 / Insung Choi.
발행사항 [대전 : 한국과학기술원, 2015].
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8034120

소장위치/청구기호

학술문화관(문화관)B1층 보존서고

DMS 15035

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리뷰정보

초록정보

In this thesis, graphitization mechanism of single crystal silicon carbide (SiC) is investigated by pulsed laser irradiation, which is widely used in GaN lift-off and low temperature polycrystalline silicon (LTPS). Such a combination of laser annealing and SiC material makes graphene, a monolayer of carbon atoms arranged to form a two-dimensional honeycomb lattice, on insulating substrate without needs for transfer process. In addition, high fluence of laser can supply enough thermal energy to synthesize graphene within nanosecond timescales. Through systematical experiments and analysis, new growth mechanisms are discovered that each laser pulse leads to melting of SiC surface. In the course of this thesis, two different mechanisms are identified with phase separation of carbon and silicon layer and amorphous phase transition via quenching. Systematical experiments and analysis were performed with a variety of laser energy densities and pulses to explore growth mechanism of pulsed-laser induced graphene on SiC surface. Time-resolved transient reflectivity (TR) measurements were employed to directly observe and understand melting of SiC surface during laser irradiation. The first irradiation leads to separation of graphitic carbon and poly-crystal silicon layer on top surface. Also, thin 3C-SiC is formed at the same time between separated layer and 4H-SiC substrate. Based on the melting signal of TR, we propose that new surface is developed to decrease surface energy. Graphite presents upper than silicon layer because it has the lowest surface energy from binary compound of carbon and silicon. Experimental result of the second laser pulse shows a vanishment of silicon layer and results in 2-3 layer graphene. This is definitely different growth mechanism compared to epitaxial graphene by thermal decomposition of SiC. Classical mechanism of graphitization is known as a sublimation of Si atoms due to its high vapor pressure. Therefore, melting of SiC cannot be occurred in equilibrium condition. Additional laser pulses make an incremental increase of graphene layer by supplying carbon sources from 3C-SiC layer. Therefore, this work demonstrates very easy and good controllability of graphene layers by increasing laser pulses. Another experimental conditions show definitely different growth mechanism via metastable amorphous SiC. Low energy of laser beam leads to amorphization of 4H-SiC surface. By increasing of laser pulses, sublimation of Si atoms from amorphous SiC layer was observed by HRTEM, EELS, and EDS mapping analysis. Interestingly, interface layer of 3C-SiC was also observed likewise experimental results with high energy density. Carbon nucleation was occurred on 3C-SiC and characterized by Raman analysis. Numerical simulation was carried out to understand temperature history with three different condition of SiC surface. After the formation of amorphous layer, surface can be melting with even low energy density due to low thermal conductivity of amorphous material. This work shows feasibility of new growth method using amorphous SiC thin film-laser interaction. Finally, for application in tuning the material properties by using pulsed laser annealing, synthesis of solid-phase doped graphene on SiC surface was studied with highly nitrogen doped substrate. This method provides the direct growth of doped graphene on an insulating substrate without an additional dopant supply. The XPS analysis confirms that the C-N bonding conformation of the N-doped graphene was pyridinic-N type. Systematic analysis of the G band shift in the Raman spectra suggests that solid-phase doping can provide precise controllability of doping concentration by simply changing the dopant concentration of SiC. This work is expected to provide a solid-phase doping strategy with excellent controllability which is primarily used in advanced Si CMOS technology.

본 논문에서, 질화갈륨의 리프트 오프와 저온다결정실리콘 성장에 널리 이용되는 펄스 레이저를 이용한 단결정 탄화규소의 흑연화 메커니즘을 연구하였다. 레이저 열처리 기술을 탄화규소에 적용하면 탄소 원자의 한 개층으로 이루어진 이차원의 그래핀을 전사공정없이 절연 기판 위에 제조할 수 있다. 레이저의 높은 에너지를 이용하면 나노초 단위의 조사시간 안에 그래핀을 성장할 수 있는 충분한 열 에너지를 탄화규소 기판에 공급할 수 있다. 체계적인 실험과 분석을 통하여, 레이저를 이용한 성장방법은 탄화규소 표면의 액체상태의 상변환을 통한 새로운 성장 메커니즘 인 것을 발견하였다. 본 논문에서, 실리콘과 탄소의 상분리와 탄화규소의 비정질화를 이용한 두개의 다른 메커니즘이 확인되었다. 탄화규소 표면 위에 성장되는 그래핀의 성장 메커니즘을 조사하기 위하여 펄스 레이저의 에너지 변화를 이용한 체계적인 실험과 분석을 진행하였다. 레이저가 조사되는 동안 탄화규소 표면의 녹는 현상을 직접관찰하기 위하여 반사율 변화 측정 방법을 이용하였다. 레이저의 첫번째 펄스에 의해 그래피틱 탄소와 다결정 실리콘의 상분리가 됨을 확인하였다. 또한 얇은 입방체 탄화규소 층이 상분리 층과 육방정 탄화규소 기판 사이에 형성됨을 확인하였다. 반사율 측정 결과의 탄화규소 표면의 녹는 현상을 참고하여, 액체상태에서 표면의 에너지를 낮추기 위하여 새로운 표면이 형성됨을 가정하였다. 탄소와 실리콘의 두개로 이루어진 화합물의 구조에서 표면에너지가 가장 낮은 구조가 흑연층이기 때문에 흑연층이 실리콘층 보다 위에 나타난다. 레이저의 두번째 펄스가 조사되면 흑연층 아래에 있는 실리콘 층이 사라지고, 두개 or 세개층의 그래핀이 형성됨을 확인하였다. 이러한 결과는 기존의 열분해에 의한 에피택셜 그래핀과 다른 성장 메커니즘을 나타낸다. 기존의 흑연화 메커니즘은 실리콘의 높은 증발 압력 때문에 실리콘이 표면에서 증발하여 그래핀이 성장되는 것으로 알려져 있다. 그러므로 탄화규소 표면의 녹는 현상은 평형상태에서 일어날 수 없다. 레이저의 펄스를 증가시키면 입방체 탄화규소층에서 공급된 탄소에 의해 그래핀 층이 증가됨을 확인하였다. 그러므로, 이번 연구를 통하여 레이저의 펄스에 의해 그래핀의 품질과 층수를 제어할 수 있음을 증명하였다. 레이저의 실험 조건을 변경하여 준안정 상태의 비정질 탄화규소를 통한 다른 성장 메커니즘을 확인하였다. 레이저의 낮은 에너지는 단결정의 탄화규소 표면을 비정질 상태로 변화시킨다. 레이저의 펄스 조사 횟수를 증가시켜서, 비정질 탄화규소 표면에서 실리콘 원자들이 증발되는 현상을 전자현미경과, 전자 에너지 손실 분광법, 에너지 분산 분광법을 이용하여 확인하였다. 흥미롭게도, 앞의 결과와 유사하게 그래핀 아래에 입방체 탄화규소층이 형성되는 것을 확인하였다. 시뮬레이션을 통하여 탄화규소 표면이 비정질로 변형되었을때, 레이저의 펄스에 의해서 표면이 충분히 녹을 수 있을 정도로 온도가 올라가는 것을 확인하였다. 이러한 원리는 단결정과 비정질 물질의 다른 열전달 특성에 의한 것이다. 이러한 연구 결과는 비정질 탄화규소 박막을 이용하여 그래핀이 성장될 수 있는 가능성을 나타낸다. 끝으로, 펄스 레이저를 이용한 그래핀 성장 기술을 응용하여, 물질의 특성을 변화시킬 수 있는 도핑 연구를 수행 하였다. 이러한 기술은 추가적인 불순물의 공급이 없이 절연 기판 위에서 직접 도핑된 그래핀을 성장할 수 있는 방법을 제시한다. 엑스선 광전자 분광법을 이용하여 탄소와 질소의 결합을 확인하였고, 라만 분광법을 이용하여 그래핀의 도핑을 증명하였다. 이러한 연구 결과는 고체소스를 이용한 도핑 기술에 응용 될 수 있을 것으로 기대된다.

서지기타정보

서지기타정보
청구기호 {DMS 15035
형태사항 xiii, 100 p. : 삽화 ; 30 cm
언어 영어
일반주기 저자명의 한글표기 : 최인성
지도교수의 영문표기 : Keon Jae Lee
지도교수의 한글표기 : 이건재
공동지도교수의 영문표기 : Sung-Yool Choi
공동지도교수의 한글표기 : 최성율
학위논문 학위논문(박사) - 한국과학기술원 : 신소재공학과,
서지주기 References : p. 89-93
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Schematic band diagram of(a) a direct gap material and (b) an indirect gap material.

Optical absorption length d and reflectivity R of Semiconductors at room temperature for different wavelength.

(a) Temperature distribution in laser-irradiated Si in which the absorption distance a-l is less than the

Free energy of amorphous, crystal, and liquid phase.

Carbon allotropes with sp2-hybridization bond configuration. The building block of the zero dimensional fullerene, the one-dimensional carbon nanotubes and the three-dinensional graphiteis consist ofthe

Mechanical exfoliation on HOPG (left-top). Epitaxial growth on SiC surface (left-bottom). Chemical

(a) Si-C tetrahedron with sp3-hybridized silicon and carbon atoms, (b) hexagonal SiC bilayer as the basic building block ofthe SiC crystal structure, (c)Si-C tetrahedral bonded in identical orientation (left image) and rotated by 60 degree with respect to each other (right image) leading to cubic (zinc blende) and hexagonal (wurtzite) SiC crystal structures.[35]

Crystal structure of different SiC polytypes displayed parallel to the (1120) plane for cubic 3C-SiC (zinc blende structure), hexagonal 2H-,4H-, 6H-SiC and rhombohedral 15R-SiC.

Comparison ofthe physical properties of4H-SiC, 6H-SiC, and 3C-SiC to those ofSi at300K.

(a) XPS data of(6V3 X 6V3) R30· reconstruction (left) and graphene (right). (b) Schematic ofbuffer

Phase diagram ofSiC in equilibrium condition.

Optical and thermodynamic parameters ofSiC with various UV excimer lasers.

Laser induced graphitization on crystal SiC surfaces with a variety ofwavelength.

Schematic of308 nm XeCl excimer laser system. It is comprises ofXeCl excimer laser (Coheren

Schematic of2D optics system. Original beam is expanded by using 2D telescope. Rectangle shap

XeCllaser temporal of(a) COMPex and (b)LPX model. The 2ndhump oftemporal is characteristic ofXeCllaser. This is important to analyzeheat transfer with numerical simulation. The LPX has higher2ndhump

(a) Schematic ofmeasurement for time-resolved transient reflectivity. Itis consistof4photo detector 3 proving laser diode and 4 channel oscilloscone All reflectivity sienals should be measured at the same time

Laser temporal data of8x pulse duration expander unit. Optically raw beam is reflective to mak

Thermal conductivities ofSic as a function oftemperature

One dimensional numerical simulation data of SiC. Main simulation parameters are thermal

Characterization of4H-SiC substrate: (a) Absorbance data show bandgap of4H-SiC (3.23 eV) an

TEM date of single-shot laser irradiation on 4H-SiC. (a) Bright filed TEM image wi1

High-resolution TEM image image ofsingle-shot laser irradiation on 4H-SiC. Phase separation of graphitic carbon (~2 nm) and silicon layer (~4 nm) is displayed. Silicon layer has mainly crystal structure and amorphous. 3C-SiCshould be formed earlier than crystallization ofsilicon because meltingtemperature ofcrystal- SiC is much higher than thatof silicon. Scale bar is 2 nm.

Numerical simulation results regarding heat transfer on 4H-SiC surface. Temperature oftop surface

Transient reflectivity data ofsingle shot laser irradiation (red line). Before (4H-SiCsurface) an

TEM data oftwo-shot laser irradiation on 4H-SiC (a) Bright field TEMimage with low magnification.

High-resolution TEM imageimage oftwo-shot laser irradiation on 4H-SiC. In contrast with HRTEM image of Figure 3.6.(b), Si layer remained under graphitic carbon layer. This is locally observed in several micrometers. This imagecan explain the vanishmentofSilayers under graphitic carbon layer. The2nd irradiation oflaser beam causes melting ofSi atoms and get out to defective carbon layer.

Transient reflectivity data oftwo-shot laser irradiation (green line). Before (1st shot) and after 2nd

TEM data of three-shot laser irradiation on 4H-SiC. (a) Bright field TEM image with 1. magnification. Very uniform surface andgrain boundaries of3C-SiC are observed likewise two-shot. Scale bar 100 TCN 6 0

High-resolution TEM image ofthree-shot laser irradiation on 4H-SiC. Locally 4H-SiC is observec

Transient reflectivity data ofthree-shot laser irradiation (blue line). Before (2nd shot) afer 3rd lase

Comparison oftransient reflectivity data from single to three-shot laser irradiation. (a) The first sh eads to laroe change ofsurface characteristic Sional of the second shot is similar to that ofthe third shot h

TEM data of thirty-shot laser irradiation on 4H-SiC. (a) Bright field TEM image with low

Transient reflectivity data of 1 to 200th shot laser irradiations. Every 20th shot is measured un

Transient reflectivity data of220 to 400th shot laser irradiations. Every 20th shot is measured un

Transient reflectivity data of420 to 600th shot laser irradiations. Every 20th shot is measured un

Schematic ofamorphization on 4H-SiC surface bypulsed laser annealing with low energy deposition

TEM analysis ofamorphization on 4H-SiC surface with different experimental conditions (a) Brigh

Electron energy loss spectroscopy (EELS) analysis of amorphous SiC and single crystal 4H-SiC. Upperline shows characteristic ofSiand Cfrom 4H-SiC. Each spectrum indicates clear information compared to

Numerical Simulation analysis of4H-SiC by heat transfer. Simulations are performed topsurface, 10

Schematic of sublimation of Si atoms from amorphous SiC surface by optimized laser conditions.

Sublimation of Si atoms from amorphous SiC laver by 1100 mJ/cm2 with 300 pulses. (a) HRTE

Numerical Simulation analysis of24 nm amorphous SiC / 4H-SiC by heat transfer. Simulations ar

Carbon nucleation and phase transformation from 4H to 3C-SiC by 1100 mJ/cm2 with 400 pulses.

Multilayer graphene on 3C-SiC/4H-SiC by 1100 mJ/cm2 with 600 pulses (a) HRTEM image shows

Numerical Simulation analysis of8 nmamorphousC/8 nm amorphous SiC/4H-SiC byheat transfe

(a) Cross-sectional HRTEM image and (b) Raman spectrum ofN-doped 20 layer graphene on 4H- SiC. (c)Cross-sectional HRTEM imageand (d) Raman spectrum ofN-doped 35layer graphene on 4H-SiC. Both

Schematic ofgraphitization via amorphousSiCfrom 4H-SiC bypulsed laser annealing. (a)Schematic

(a) Schematic illustration ofthe synthesis method for laser-induced N-doped graphene on N-d

XPS C1s (a) and Nls (b) spectra taken from pristine (i,toppanel) and N-dopedgraphene (ii, bottor panel). The C1s peak of pristine graphene is characterized by three peaks at 283.8, 284.6, and 285.5 e

XPS Cls(a) and N1s (b)spectrum taken from highly N-doped SiC substrate without laser irradiation

(a) Raman spectra on the SiC surface corresponding to various laser fluences of 1045 mJ/cm2 (red line), 1124 mJ/cm2 (green line), 1196 mJ/cm2 (blue line), and 1301 mJ/cm2 (cyan line). Black line shows the characteristic of 4H-SiC. (b) Simulated temperature distribution as a function of time using singlepulse. The maximum surface temperatures correspond to 2896K at 1045 mJ/cm2 (red line), 3068 K at

Simulated temperature distribution versus depth on SiC surface (a) Maximum surface temperature

Systematic analysis on the G band position ofthe graphene grown on the SiC with different dopant concentration: undoped (n<1X 1016 cm-3) 6H-SiC, low-doped (n= 9 X 1017 cm-3) 6H-SiC, mid-doped (n =2.2x 1018 cm-3) 4H-SiC, and high-doped (n=7.4x 1018cm-3) 4H-SiC. Star labels represent the average value ofthe G band positions from each substrate. x marks indicate minimum and maximum position fromeach

Ramanspectra ofpristine(blueline) and N-doped graphene(redline). TheD bandon pristine

Systematic analysis ofG band position on various substrates: undoped (n <1 X 1016 cm-3) 6H-SiCS: