서지주요정보
Single-crystal graphene growth from mobile hot-wire-assisted CVD system = 이동 열원을 이용한 단결정 그래핀의 성장 연구
서명 / 저자 Single-crystal graphene growth from mobile hot-wire-assisted CVD system = 이동 열원을 이용한 단결정 그래핀의 성장 연구 / Jinwook Baek.
발행사항 [대전 : 한국과학기술원, 2019].
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For the last decade, graphene have been emerging as one of ideal materials for the building block of the forthcoming nanotechnology, due to their unique electrical, mechanical and mechanical properties. Although various graphene synthesis method was developed, the intrinsic properties of graphene is limited by the defect generation during growth and transfer process. Due to the uncontrollable random nucleation and sequential growth of graphene grains on catalytic substrate, grain boundaries are generated in graphene films. Most of studies report that grain boundaries in graphene film impede the electric transport of graphene. Therefore, minimizing the grain boundaries is one of the key techniques for high-quality graphene growth. For obtaining large single-crystal graphene grain, we improve the conventional CVD system by locating mobile hot-wire on bottom substrate for separately control the nucleation and growth of graphene at initial growth stage. After optimizing the graphene growth condition, high-angle tilt boundary graphene domain was observed through recrystallization-like stitching of graphene grains. For the purpose of achieving single-crystal graphene, pre-treatment of catalytic substrate was conducted before graphene growth. Cu-Ni alloy substrate was used for nucleation of small domain which facilitate to rotation of initially grown graphene grains. Furthermore, Cu(111) substrate was employed in order to nucleate the aligned graphene domain at initial growth stage. As a result, high angle tilt boundary graphene domain in graphene film was reduced compared to polycrystalline pure copper. In case of transfer-free growth of graphene, carbon-containing polymers such as PE, PEG, PMMA, PS was used for solid carbon source. Owing to the dual heating system in our CVD, uniform graphene was obtained on dielectric substrate. The effect the vapor pressure of catalytic metal on crystallinity of graphene is also studied by using catalytic metal wire. The primary factor for graphene growth is catalytic reaction of metal nanoparticle and carbon precursor in vapor phase. Although the metal nanoparticle was not fully etched from as-grown graphene, uniform and low-defect graphene was directly grown on dielectric substrate. We believe our report offers a significant contribution to understanding the growth mechanism of graphene and would be a fundamental technology for growth of high quality two dimensional materials.

지난 10 여년 간 그래핀은 물질 자체의 우수한 전기적, 기계적, 열적 특성으로 인하여 나노기술 분야의 이상적인 기초물질중의 하나로 떠오르고 있다. 이에 따라 다양한 그래핀 제조 방법 및 응용 기술이 개발되었지만 제조 과정 및 공정 과정에서의 결함 발생으로 인해 그래핀의 우수한 이론적 특성이 제한되어 그래핀이 상용화되는 데에 장애물이 되고 있다. 그래핀의 핵 생성 및 성장의 과정에서, 무작위한 핵 생성으로 인해 만들어진 그래핀 필름에 결정립계가 존재하게 되고, 최근 관련 연구에서는 이러한 결정립계가 그래핀의 전하수송 특성을 저해시키는 요인으로 작용한다고 보고하고 있다. 따라서 고품질의 그래핀을 제조하기 위해서는 이러한 결정립계의 밀도를 최소화시키는, 단결정 그래핀 성장 연구가 고품질 그래핀을 제조하는 데 중요한 핵심 기술이라고 할 수 있다. 이러한 과제를 해결하기 위하여, 본 학위논문에서는 일반적인 화학기상증착법을 개선시켜 고온의 이동 가능한 열선을 장치한 새로운 화학기상증착법을 통해 그래핀을 제조하였다. 투과전자현미경을 통한 그래핀의 방향성 분석 결과, 만들어진 그래핀은 한 방향으로 정렬된 결정립 내에 고각도 경계를 갖는 결정립을 포함하는 구조로 존재함을 관찰하였고, 이러한 고각도 경계 결정립을 제거하기 위해 그래핀을 성장하는 기판을 제어하는 연구를 진행하였다. 먼저 기존에 사용하던 구리 기판에 니켈을 합금시켜 만든 구리-니켈 합금 기판을 통해 그래핀을 제조하였다. 일반적으로 니켈의 경우 그래핀 성장 온도에서 구리보다 높은 탄소 고용도를 갖기 때문에 합금 기판의 경우 그래핀의 핵 생성이 촉진되어 성장 초기에 형성되는 그래핀의 그레인이 더 작은 크기로 형성된다. 이러한 효과로 인해 고각도 경계 결정립의 밀도가 감소하는 현상을 관찰하였다. 또한 그래핀과 격자 부조화가 작은 것으로 알려진 (111) 방향의 구리 기판을 이용해서 그래핀을 제조하는 연구가 진행되었다. (111)방향의 구리 기판에서 그래핀이 제조되는 경우 성장 초기에 그래핀의 결정립이 한 방향으로 정렬되어 핵 생성이 이루어지고, 정렬된 결정립이 성장함에 있어서 인접한 결정립이 만날 때 결정립 경계가 없이 합쳐지게 되어 큰 단결정 그래핀이 형성되게 된다. 고품질 그래핀을 제조하는 또 하나의 중요한 기술인 전사 공정을 생략하는 그래핀 성장법의 경우, 탄소를 포함하는 다양한 고분자 물질을 탄소 전구체로 이용하여 절연체 기판에 그래핀을 직접 성장하는 연구를 진행하였다. 또한 촉매 물질로 이루어진 열선을 이동 열원으로 이용하여 증기 상태의 나노입자를 촉매로 절연체 기판에 그래핀을 직접 성장시키는 연구를 진행하였다. 단결정 및 고품질 그래핀을 제조하기 위한 다양한 접근으로 구성된 본 학위논문은 그래핀의 성장 메커니즘에 대한 이해와 2차원 물질의 고품질 성장 기술 구현에 대한 기초 연구 결과로서 의의를 갖는다.

서지기타정보

서지기타정보
청구기호 {DMS 19005
형태사항 iii, 110 p. : 삽화 ; 30 cm
언어 영어
일반주기 저자명의 한글표기 : 백진욱
지도교수의 영문표기 : Seokwoo Jeon
지도교수의 한글표기 : 전석우
수록잡지명 : "Transfer-Free Growth of Polymer-Derived Graphene on Dielectric Substrate from Mobile Hot-Wire-Assisted Dual Heating System". Carbon, Vol. 127, 41-46(2018)
수록잡지명 : "Growth of Graphene on Non-Catalytic Substrate by Controlling the Vapor Pressure of Catalytic Nickel". Carbon, Vol. 143, 294-299(2019)
학위논문 학위논문(박사) - 한국과학기술원 : 신소재공학과,
서지주기 References : p. 101-106
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Graphene synthesis method.

Electronical properties degrade by graphene domain boundaries.

Strategy for making single crystal graphene.

Synthetic method and spectroscopic analysis of graphene by MHW assisted CVD system. (a) Synthetic protocol ofhighly oriented graphene from nanocrystallized graphene. (b) Raman spectrum ofbefore and after wire scanned over graphene. (c, d) DF TEM images (scale bar, 200 nm) of the as-grown graphene before (c) and after (d) wire scanning atT,sub of820 'C.

Characteristics of the graphene synthesized usinga stationary hot-wire on Cu foil. (a) Schematic diagram of the nanocluster graphitic graphene formation through a stationary hot-wire on Cu foil. (b-d) The correlation between the distance of the stopped hot-wire and Raman Ip/Ic ratio (black dot), real Tsub considering Tw (blue rhombus), and the sheet resistance (red box) atTsub =610, 750 and 820 CC

(a) AFM and (b) SEM imagesofas-grown graphene on Cu substrate before the scanning ofthe hot- wire having more than 100 nm sized amorphous carbon. The roughness of Cu foil is decreasing due to thick carbonaceous particles. (c) AFM and (d) SEM image ofgraphene afterthe hot-wire scanning on Cufoil without transfer process. The graphene were grown in whole Cu surface without residual particles. (e) AF

Observation of oriented, nanosized graphene domains after moving the hot-wire. (a-f) DF TEM images (left; scale bar, 200 nm) and high resolution TEM images (right; scale bar, 2 nm) of the as-grown graphene before (a-c)and after (d-f) wire scanning at Tsub of610 'C (a andd),750 'C (b and e), and 820 'C (c and f). (g-1) Diffraction patterns of an as-grown graphene corresponding with DF TEM images in

Graphene nanocluster without'Vw at610, 750 and 820 Tsub. (a-C) High resolution TEM image of the pre-formed graphene nanocluster from 610to 820 'C. The scale baris 2 nm. (d-f) The inset of the enlarged TEM image at different Tsub values correlating with (a-c), respectively. The pre-formed sub-nanometer-sized graphene nanocluster is colored yellow and blue, (d) and grain boundary from the tens-of-na

Effect of mobile wire and the correlation between the scan speed and electrical properties. (a) Graphene sheet resistance (blue) and Ip/Ic ratio (black) in the Raman spectra as a function ofVw with Tsub ranging from 610 to 820 'C. (b) Raman spectra of wire scanned as-grown graphene at the optimal scan speed shown the lowest sheet resistance with the indicated temperatures from 610 to 820 'C.

Pre-formed nanocrystalline graphene without Vw at Tsub =820 'C. (a) DF TEM image of the pre- formed graphene nanocluster at Tsub = 820 'C. The inset shows diffraction pattern of randomly oriented graphene. (b) High-resolution TEM image of adsorbate in red box of (a). (c-e) Slightly changed TEM aperture angles of DF TEM images corresponding with (a) show a non-fixed domain size as a shape of domain

Theaverage Raman spectra ofas-grown graphene atTsub =820 'C with various wire scan speed.

Raman mappingimagesof wire-scanned graphene at differentT.sub values. (a) Raman Ip/Ic ratio and (b) I2D/IG ratio within a 30 um X 30 nm area. At820 'C, the graphene exhibits the lowest D peakand the highest 2D peak. The Raman mapping derived from 900 points within 30 nm X 30 nm areas. (c) High-resolution optical images of wire-scanned graphene transferred on Si02/Si for the differentTsub in the pr

The effect of substrate temperature, wire temperature, and wire scan speed on graphene grov Schematic illustration of the fabrication of the graphene growth by (a) the heat of substrate only (b) scann hot-wire only (c) both substrate and stationary hot-wire and (d) both substrate and scanning wire. (e) Rar spectra of as-grown graphene correlated with (a-d) the black and pink line indicate the resu

Domain characterization. (a) TEM domain mapping of wire-scanned graphene on the TEM grid with a boundary of same domain angle (red). Scale bar, 100 hm. (b-d) DF TEM image ofthe position marked by the cyan, pink and green squares in (a), respectively. Scale bar, 200 nm. The insetin each image presents the corresponding diffraction patterns. These DF images and diffraction patterns indicate the coin

Bright-colored DF images at the global graphene domain boundary with changing TEM aperture angles. (a) DF image of the main domain (0*, blue), (b) the overlapping the domains. (c) DF image ofanother domain (30', orange). All graphene domain boundaries are composed ofHATBs.

TEM images of alarge-area distribution ofincubated HAT domains in a global graphene domain. (a) TEM image of the global graphene domain represented inFig. 2.11(a). (b) Enlarged Mesh 1 image of the global graphene domain in (a). (c, d) Thelargearea TEM images incubated with small HAT domains.

The global graphene domain boundary in wire-scanned graphene with a HATB. (a) Domain boundary ofa global graphene domain. (b) Diffraction pattern taken from a region in (a). The gray image at right corresponds to the bright white six-fold symmetry of (b) and the black image at rightindicates the light white six-fold symmetry of(b). HATBs are formed (28.4%) and are depicted in (c) with the domain b

Recrystallization and healing of scanned graphene. (a) Diagrams of the wire-scanning proce without a carbon source during wire moving. (b) Detailed schematic illustration of the thermal vibration carbon under the wire in (a) with carbon adsorption and desorption. (c) Raman spectra of the graphene derive from the scanned wire, the stopped wire and the scanned wire withoutan additional carbon source

TEM images in wire-scanned graphene under restricted carbon feed gas. (a) High-resolution TEM image overlaid with color depicting the shape as it follows the orientation of the graphene domain. The inset exhibits the diffraction pattern from each domain. (b), Integrated diffraction patterns in the insetof(a).

Electronic properties.

Strategy forreducing HATB domains. (a) Scheme ofthegraphenegrowthin MHW-CVD system (b ERot between a graphene grains and metal substrate (c) SAED of the region with HATB domains (e) the percentage ofthe region with HATB domains in the graphene grown on pure copper and copper-nickel alloy.

Ni contentatthe surface ofCu-Ni alloy and crystallographic orientation of substrate (a) Analysisof Ni content at the surface of Cu-Ni alloy (b) XPS depth profile of Cu-Ni alloy with 2.43 Ni atomic % (c) EBSD analysis ofthe pure Cu before annealing, after annealing and the pure Cuand Cu-Nialloy.

Observation of controlling the nucleation density and grain size of graphene (a) Method of nickel alloying with copper. SEM images of graphene domains grown on pure copper (b) and on the Cu-Nialloy with 4.25 at% of Ni (c) atinitial growth stage. False color, dark field image ofgraphenegrown on pure copper (d) and on the Cu-Ni alloy with 4.25 at% ofNi (e). Domain size distribution of graphene grown

SEM images of graphene domains grown on Cu-Ni alloy with 0.99 % Ni and 2.43 % Ni

(a) Ramanspectrum ofgraphene grown on each metal substrate without wire scanning (b) SAED of thegraphene

Growth condition optimization for graphene film with wire scanning from MHW-CVD. Raman spectrum of graphene grown on pure copper (a) and on copper-nickel alloy (b) atvarious substrate temperature (b) D/G peak ratio and sheet resistances of Raman spectrum grown with various wire scan speed atTsub = 830 'C.

SEM images of graphene morphologies with varying Vw and the thickness ofnickel deposition on copper foil (varying Ni contents).

Ip/Ic ratio and I2D/Ic ratio of graphene with various Vw

Sheet resistance of graphene grown with various V w.

Additional SAED of graphene grown on pure copper with hot-wire scanning

Additional SAED of graphene grown on Cu-Ni alloy with hot-wire scanning.

TEM analysis of graphene. (a) Diffraction pattern for one hole. (b) Bright-field TEM image of graphene on a TEM grid. (c) Misorientation angle distribution measured from SAED patterns forthe graphene films grown on each substrate. (d) Ratio distribution ofthe main diffractionpeakto the tilted minorpeakforthe graphene films grown on each substrate.

Graphene field effecttransistor. (a) SEM image. (b) Id-Vgcurve. (c) Average mobility ofgraphene grown on pure Cu and CuNi alloy.

Schematic illustration of graphene growth on Cu(111)

Pre-treatment of polycrystalline copper foraligned Cu(111) substrate. (a) Digital image ofCu(111) (b) EBSD analysis ofdesignated position shown in (a). (c) Color map ofthe orientation ofCu.

SEM analysis ofinitial growth stage of graphene.

Statistical analysis ofinitially formed graphene grains. (a) Misorientation angle between graphene grainsatVw =4.0 mm/min. (b) Misorientation angle between graphene grains atVW =2.5 m/min.

The average Raman spectra of graphene growth with varying Tsub.

Optimization ofthe crystallinity ofgraphene growth with varying Vw·

TEM Analysis of graphene grown on Cu(111). (a) Optical image of TEM grid. (b) Profile of the intensity of diffractionspotsalong blue line in (c). (c-h) Representative SAED ofgraphene growtn on Cu(111).

DF-TEM analysis of graphene grown on Cu(111).

Synthetic method and analysis ofgraphene by MHW-DHS.(a-d) Synthetic protocol of transfer-free graphene from spin-coated polymers. (e, f)XPS depth profileanalysis ofhot-wall type CVD and MHW-DHS (g) Optical image of graphene from spin-coated PE. Scale bar is 20 um. (h) Raman spectra of graphene from spin- coated PE, PEG, PMMA, PS.

(a) AFM image of the graphene/Si02 boundary. (b) Heightprofilefrom the red line in (a).

(a) Typical selected area electron diffraction from the graphene grown from PE as a carbon source and line profilethrough the direction of white arrow.

Effect of growth temperature and mobile wire scanning on the crystallinity and coverage of as- grown graphene. (a), (e) Raman spectra of graphene with varying (a) Growth temperature and (e) Wire scan speed. (b-d) Opticalimage ofgraphenegrown at(b) Tsub ~430'C, (c) Tsub ~530'C,and (d) Tsub ~630'C Tw was fixed at 1250 'C. (f-h) Optical image of graphene with varying hot-wire scan speed of(f)Vw =0.5m

Effectof growth temperature on the coverage and thickness of graphene withouthot-wire scanning Scale bar ~ 20 um.

Determination of the hot-wire scan speed.

Thermogravimetric analysis of PMMA, PS, PE, PEG

The amount of diffused carbon in nickel layer and improvement ofgraphene coverage. (a-d) XPS depth profileanalysis of(a) PMMA (b) PS (c) PEG (d) PE. Optical image for the effectoof growth temperature (fixed Tw with varying Tsub) on graphene coverage from (e) Tsub ~200'C (f) Tsub ~ 400 CC (g) Tsub ~600 'C. Scale baris 20 um.

Characterization ofgraphene on SiO2. (a-b) 3D AFM image of (a) Transfer-free graphene and (b) Transferred graphene. (c-d) Raman 2D mapping of graphene with (c) Ip/IG ratio and (d) I2D/IG ratio. Scale baris 10 um. (e) Sheet resistance ofgraphene from PE, PEG, PMMA,PS.

Effect of nickel trace on electric performance ofgraphene

Synthetic method and analysis ofgraphene grown on non-catalytic substrate. (a) Growth process of graphene on non-catalytic substrate. (b-d) TEM image ofthe early stage of graphene growth. (e) Raman spectra ofgraphenewith varying the PNi·

Digital image of MHW-CVD system.

Energy-cispersive x-ray analysis ofNi cluster containing carbon atoms.

The effectof the MHW depends on the distance between the stationary wire and NCS

Nanotube, or onion-like carbon structures observed in somepartofgraphene film

Effect of partial vapor pressure of Ni on the crystallinity of graphene. Higher contrast indicates larger Ni particledensity.

The amountof deposited Ni particle andimprovementoographene crystallinity and uniformity (a-c) AFM image ofthe Ni particle and Raman spectra ofgraphene at (a) Tsub ~ 600 'C, (b)Tsub ~ 640 ic (c)Tsub 600 iC (d-f) Raman mappingresultofIp/Ic ratio correlated with (a), (b), (c).

Effectof graphene on stickingofnickel on substrate. (a) 2D and (b) 3D AFM analysis ofthe surface ofgraphenegrowth withoutCH4.

Investigation of the dominant factor for the graphene growth. (a) Synthetic protocol of graphene grown on non-catalytic substrate. (b) Growth condition for the graphenegrowth (c-e) AFM image and Raman spectra ofgraphenefrom condition I. II, III.

Comparision of graphene growth atdifferentTw and Ptot but same range ofPNi.

Optical properties of graphene grown on various NCS. (a) Digital image of graphene grown on quartz and sapphire. (b) UV-Visspectroscopy ofgraphene (c) Raman spectra ofgraphene on various NCS.

Surface of graphene grown on NCS after nickel etching. (a) AFM image of graphene grown on NCS after nickel etching. White dots indicates unetched nickel particles. (b) Phase image of(a) showing more distinctdifferences between graphene and nickel particles. (c) Magnified AFM images oforange box in (a).