An experimental study of the deposition of the charged $SiO_2$ particles on a copper cylinder in electrostatic fields was carried out. Particles had diameters ranging from 1 to 5 microns and were charged by the free ions emanated from the sonic ion beam generator. Laser light scattering method was used to examine the relative number concentrations of particles in the test section. Particle deposition rates as a function of free ion density and electric field strength were measured by analyzing scanning electron microscope (SEM) photographs. In this experimental system, initial particle charges were relatively high and the effect of ion density on the deposition rate was very small. On the other hand, irrespective of the ion beam generation, the deposition rates were increased by 50% when the electric field strength was doubled.
