서지주요정보
광위상간섭법에서 기준위상의 수치해석 보정 = Numerical correction of reference phases in phase-shifting interferometry
서명 / 저자 광위상간섭법에서 기준위상의 수치해석 보정 = Numerical correction of reference phases in phase-shifting interferometry / 한건수.
발행사항 [대전 : 한국과학기술원, 1994].
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8004231

소장위치/청구기호

학술문화관(문화관) 보존서고

DPE 94006

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초록정보

Phase-shifting interferometry has been widely used for the ultraprecision measurement of surface profiles. Its metrogical principle is to measure the wavefront reflected off the test surface relative to the wavefront off a reference surface, by analyzing multiple interferograms produced by the two wavefronts with different reference phases. The reference phases are introduced populary by using a piezoelectric type phase-shifter moving the test or reference surface to change relative optical path difference. In practice, due to deterministic and random errors inherent in the piezoelectric phase-shifter, the actual reference phases deviates from the intentional values so that a suitable compensation scheme is needs if measuring accuracy is to be enhanced. Previous work for the purpose has mainly concentrated on deterministic lineary compensations of the phase-shifter prior to or after obtaining interferograms. In practical measurement environment, however, phase-shifter exhibits a considerable amount of nonlinear behaviors and also the random errors caused by vibrational disturbances apper often significant. In this study, a new computational algorithm of phase- shifting interferometry which can effectively eliminate the uncertainty errors of the reference phases encountered in obtaining multiple interfrograms The algorithm treats the reference phases as additional unknowns and determines their exact values by analyzing interferograms using numerical least square technique. A series of simulations and experimental results prove that this algorithm can improve measuring accuracy being unaffected by the nonlinear and random errors of phase-shifters, compared with the conventional algoritms

서지기타정보

서지기타정보
청구기호 {DPE 94006
형태사항 xi, 126 p. : 삽화 ; 26 cm
언어 한국어
일반주기 저자명의 영문표기 : Geon-Soo Han
지도교수의 한글표기 : 김승우
지도교수의 영문표기 : Seung-Woo Kim
학위논문 학위논문(박사) - 한국과학기술원 : 정밀공학과,
서지주기 참고문헌 : p. 121-126
주제 Piezoelectric ceramics.
Least square.
Surfaces (Technology) --Analysis.
간섭계. --과학기술용어시소러스
압전 소자. --과학기술용어시소러스
형상 측정. --과학기술용어시소러스
최소 제곱법. --과학기술용어시소러스
보정 (계측) --과학기술용어시소러스
Interferometry.
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