서지주요정보
Ni/Si 계면에서 Ni 실리사이드의 핵생성과 성장에 관한 TEM 연구 = A TEM study on Ni silicide nucleation and growth at the Ni/Si interface
서명 / 저자 Ni/Si 계면에서 Ni 실리사이드의 핵생성과 성장에 관한 TEM 연구 = A TEM study on Ni silicide nucleation and growth at the Ni/Si interface / 이상호.
발행사항 [대전 : 한국과학기술원, 1993].
Online Access 원문보기 원문인쇄

소장정보

등록번호

8003824

소장위치/청구기호

학술문화관(문화관) 보존서고

MEM 93014

휴대폰 전송

도서상태

이용가능(대출불가)

사유안내

반납예정일

리뷰정보

초록정보

In this study the nucleation and growth of Ni silicide(NiSi and $NiSi_2$) grown by evaporation and furnace annealing has been investigated by TME (Transmission Electron Microscopy). Ni(99.9%) was deposited by thermal evaporation on B-doped(1-3 Ωcm) (001) Si substrate. Prior to the evaporation, wafer was cleaned chemically to remove impurities on Si wafer. 2 nm of native oxide layer was remained after chemical cleaning. About 8 nm of films were deposited on (001) Si wafer. The films are $Ni_2Si$ phase and intermixed amorphous layer between $NiSi_2$ and native oxide layer. Furnace annealing was carried out in 1×$10^{-6}$ Torr vacuum to prevent oxygen adsorption in Ni. Annealing temperature was 800℃ to produce $NiSi_2$, and 600℃ to produce NiSi. The shape of $NiSi_2$ nucleus was inverted pyramid consisted of {111} faces, and has grown to Si substrate with epitaxial orientation relationship between $NiSi_2$ and Si substrate i.e. $[001]_{NiSi_2}$//$[001]_{Si}$ and $(001)_{NiSi_2}$//$(001)_{Si}$. {100} $NiSi_2$ interfaces were also observed at the initial stage of nucleation. But, as the nucleus grow, {100} interfaces disappeared and the interfaces of nucleus became only {111} planes because {111} planes are lowestenergy planes. Ni silicide grows into Si substrate due to Ni diffusion. But the nucleus partly grows into the evaporated film due to Si diffusion. After 40 h annealing at 800℃, continuous $NiSi_2$ film was grown and inverted pyramid shape of $NiSi_2$ continued nucleation at the interface between $NiSi_2$ film and Si substrate. After 40 h annealing at 800℃, $NiSi_2$ nucleus that has $[001]_{Si}$//$[112]_{NiSi_2}$ orientation relationship was observed. It has grown in <110> and <111> directions and has sharp interfaces perpendicular to <111> directions. After 4h annealing at 600℃, NiSi was nucleated from $Ni_2Si$ and formed islands on the native oxide. $Ni_2Si$ had had no reaction with Si substrate and produced NiSi islands and Ni phase. Instead of Ni diffusion, $Ni_2Si$ decomposition was held according to the reaction $Ni_2Si$ → NiSi + Ni.

서지기타정보

서지기타정보
청구기호 {MEM 93014
형태사항 [iii], 59 p. : 삽화, 사진 ; 26 cm
언어 한국어
일반주기 저자명의 영문표기 : Sang-Ho Lee
지도교수의 한글표기 : 이정용
지도교수의 영문표기 : Jeong-Yong Lee
학위논문 학위논문(석사) - 한국과학기술원 : 전자재료공학과,
서지주기 참고문헌 : p. 57-59
주제 Silicides.
Nucleation.
Growth.
Surfaces.
핵생성. --과학기술용어시소러스
계면. --과학기술용어시소러스
증발. --과학기술용어시소러스
전자 현미경 관찰. --과학기술용어시소러스
QR CODE

책소개

전체보기

목차

전체보기

이 주제의 인기대출도서