In this thesis, three-level Type I censored constant stress accelerated life test (ALT) plans for the Weibull lifetime distribution are proposed. It is assumed that the Weibull scale parameter is a log linear function of the stress. The three levels are equally spaced and the ratio of allocations of test items to high and middle levels is fixed.
Tables for optimum test plans are given, and the proposed ALT plans are compared with three other ALT plans with respect to asymptotic variances of the maximum likelihood estimator of the 100Pth percentile at design stress and robustness to departures from the assumptions made.
