An analysis of the electrical contact resistance between two conducting bodys without tarnish film and of the current density distribution in the contact area was carried out. It was assumed that the asperities are to be considered as the axisymetricaly distributed cones with Gaussian height distribution, and that the deformation at the contact between two rough surfaces is equivalent to that between a single rough surface and a hypothetical rigid smooth plane.
The contact resistance was measured under various combinations of pressure and temperature, and the current density distribution by using enamel-coated copper wires with different diameter which simulate the different pressure. The experimental and calculated contact resistance and current density distribution were in a considerably good agreement.
The theoretical and experimental results revealed that pressure distribution and temperature have a great influence on the contact resistance and the current density distribution, while surface roughness has a relatively small influence.
