The GaAs MESFET with the gate length of 3㎛ is fabricated by using the mask aligner which was made in our laboratory. Its gate metal is cromium. The transconductance gm of 15mS/mm is obtained.
The separation of source and drain of the fabricated GaAs MESFET is 10㎛ and it is the value down to 1/3 in physical dimension of those made in our laboratory up to now.
The fabrication of GaAs MESFET with shorter gate length compared withthat made in this thesis is needed for the more stable and the better D.C. characteristics.