서지주요정보
구형(矩形) 대역 투과 필터의 신속한 설계법과 필터 성능의 실험적 확인 = Fast design process for square top band pass filters and experimental verification of the filter performance
서명 / 저자 구형(矩形) 대역 투과 필터의 신속한 설계법과 필터 성능의 실험적 확인 = Fast design process for square top band pass filters and experimental verification of the filter performance / 박경현.
저자명 박경현 ; Park, Kyung-Hyun
발행사항 [서울 : 한국과학기술원, 1985].
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소장정보

등록번호

4103336

소장위치/청구기호

학술문화관(문화관) 보존서고

MAP 8509

SMS전송

도서상태

이용가능

대출가능

반납예정일

초록정보

Square top BPF(band pass filter) with wide passband and square shaped top is designed and fabricated. The multilayer systems are much complicated so that intuitive understanding is generally inhibited. Therefore new method of analysis is developed and introduced in this study. Considering two effective surfaces in multilayer system, it is possible to analyze a single peak BPF which has two high reflectance multilayer stacks and a single spacer between them. The method can equally be used in designing a single peak BPF and then repeating single peak BPF designing process properly, it arrives finally to the square top BPF wanted. Under the condition that total number of layers does not exceed 20, reasonable stability against random thickness error within 4%, typical square top BPF design is obtained for various halfwidth. For the most precise thin film thickness monitering, the white light thickness monitoring system using a monochromator and a lock-in amplifier is developed in this experiment. Lock-in amplifier is also developed for noise reduction in the white light thickness monitoring system. Square top BPF prepared by thermal vacuum evaporation has 5∼10% lower peak transmittance and halfwidth deviation below ±5% compared to the design value. And its center wavelength of transmittance is shifted within ±1% from its reference wavelength.

서지기타정보

서지기타정보
청구기호 {MAP 8509
형태사항 iv, 114 p. : 삽도 ; 26 cm
언어 한국어
일반주기 부록 수록
저자명의 영문표기 : Kyung-Hyun Park
지도교수의 한글표기 : 공홍진
지도교수의 영문표기 : Hong-Jin Kong
학위논문 학위논문(석사) - 한국과학기술원 : 물리학과,
서지주기 참고문헌 : p. 102-104
주제 Thin films, Multilayered.
Thickness measurement.
대역 필터. --과학기술용어시소러스
다층막. --과학기술용어시소러스
두께 측정. --과학기술용어시소러스
Electric filters, Bandpass.
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