서지주요정보
제품의 크기를 고려한 가속수명시험의 설계 = Design of accelerated life testing for products with unequal size
서명 / 저자 제품의 크기를 고려한 가속수명시험의 설계 = Design of accelerated life testing for products with unequal size / 윤형제.
발행사항 [대전 : 한국과학기술원, 1992].
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8002789

소장위치/청구기호

학술문화관(문화관) 보존서고

MIE 92014

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This thesis is concerned with the problem of optimally designing accelerated life test plans for products with unequal size in which two levels, high and low, of stress and constantly applied. It is assumed that the failure rate of product is directly proportional to its size. Two life distributions, exponential and Weibull, are considered. For exponential life distribution, it is assumed that the mean life is a log-linear function of(possibly transformed) stress. Minimizing the asymtotic variance of maximum likelihood estimator of the mean life at the design stress is used as an optimality criterion. Two cases where the test procedure is observed continously in time until a prespecified censoring time are considered: 1) Two stress levels and number of test products allocated to each are given, a heuristic algorithm which determines the sample allocation policy is given. 2) High stress level and the total number of test products are given, modified coordinate descent method which determines the low stress level and the number and size of test products allocated to it is given. For Weibull life distribution, it is assumed that the scale parameter is a log-linear function of stress. Minimizing the asymtotic variance of maximum likelihood estimator of the 100p-th percetile at the design stress is used as an optimality criterion. Two cases where the test procedure is observed continously in time are considered: 1) Two stress levels and number of test products allocated to each are given, a simple algorithm which determines the sample allocation policy is given for complete observation. 2) High stress level and the total number of test products are given, using the algorithm for exponential life distribution, procedure to determine the low stress level and the number and size of test products allocated to it is given for type I censoring. Optimal plans for test products with unequal size are compared with those for test products with equal size. Sensitivity analysis is given for Weibull life distribution. Optimal ALT plan for exponential life distribution is compared with that for Weibull life distribution.

서지기타정보

서지기타정보
청구기호 {MIE 92014
형태사항 [iii], 75 p. : 삽화 ; 26 cm
언어 한국어
일반주기 부록 수록
저자명의 영문표기 : Hyung-Je Yun
지도교수의 한글표기 : 배도선
지도교수의 영문표기 : Do-Sun Bai
학위논문 학위논문(석사) - 한국과학기술원 : 산업공학과,
서지주기 참고문헌 : p. 65-67
주제 Inspection.
Weibull distribution.
수명 시험. --과학기술용어시소러스
제품 검사. --과학기술용어시소러스
최우법. --과학기술용어시소러스
지수 분포. --과학기술용어시소러스
Accelerated life testing.
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