서지주요정보
넓은 선폭의 광원을 사용한 Michelson 간섭계의 특성 측정 및 응용에 관한 연구 = Characterization and application of michelson interferometer with broadband optical sources
서명 / 저자 넓은 선폭의 광원을 사용한 Michelson 간섭계의 특성 측정 및 응용에 관한 연구 = Characterization and application of michelson interferometer with broadband optical sources / 이명래.
발행사항 [대전 : 한국과학기술원, 1992].
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8002583

소장위치/청구기호

학술문화관(문화관) 보존서고

MAP 92027

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In this thesis, a Michelson interferometer with broadband optical sources was characterized and were investigated its applications. The coherence properties of a multimode laser diode as a broadband optical sources have been investigated using the scanning Michelson interferometer. In order to obtain broadband spectrum, a multimode laser diode was operated at the current level of 51.0mA below the threshold current of 51.4mA. In this case, the linewidth of the multimode laser diode was 7.65nm which was broader than the conventional laser light sources. In the output of the Michelson interferometer, the packets of interference fringes were formed because of the superposition of the longitudinal mode due to the residual Fabry-Perot cavity modulation of the spectrum. Separation between two adjacent longitudinal modes was 3.25Å and the coherence length was about 40 μm. This scanning Michelon interferometer and the multimode laser diode as a broadband optical source was coupled to another unbalanced interferometer. And the optical path differences of the unbalanced interferometer was measured by path matching condition. As an application of this scanning Michelson interferometer with multimode laser diode, a polarization maintaining fiber was used as an unbalanced interferometer and we have localized polarization coupling point in the polarization maintaining fiber. When one coupling point was located at 1.63m away from the fiber end, we could deduce the location of the coupling point from the optical path differences of scanning Michelson interferometer. Also, as an another application of the interferometer, we have constructed a dual interferometer system with Fabry-Perot interferometer. A glass substrate was used as Fabry-Perot interferometer and the refractive index of the substrate was measured to be 1.46 at 830nm.

서지기타정보

서지기타정보
청구기호 {MAP 92027
형태사항 [iii], 47 p. : 삽화 ; 26 cm
언어 한국어
일반주기 저자명의 영문표기 : Myung-Lae Lee
지도교수의 한글표기 : 김병윤
지도교수의 영문표기 : Byoung-Yoon Kim
학위논문 학위논문(석사) - 한국과학기술원 : 물리학과,
서지주기 참고문헌 : p. 46-47
주제 Interferometry.
Fabry-Perot interferometers.
Michelson 간섭계. --과학기술용어시소러스
광원. --과학기술용어시소러스
반도체 레이저. --과학기술용어시소러스
Semiconductor lasers.
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