서지주요정보
무연 솔더와 무전해 니켈-인 하부금속 층간의 계면 반응과 솔더 조인트에 미치는 비스무스 합금의 영향 = Effects of Bi on interfacial reaction and bump strength in electroless Ni-P UBM/ Pb-free solder bumps
서명 / 저자 무연 솔더와 무전해 니켈-인 하부금속 층간의 계면 반응과 솔더 조인트에 미치는 비스무스 합금의 영향 = Effects of Bi on interfacial reaction and bump strength in electroless Ni-P UBM/ Pb-free solder bumps / 조문기.
발행사항 [대전 : 한국과학기술원, 2004].
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소장정보

등록번호

8015089

소장위치/청구기호

학술문화관(문화관) 보존서고

MAME 04029

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초록정보

Flip chip is one of the most promising electronic packaging interconnection technologies. Because flip chip realizes more I/Os than Wire-bonding or TAB does. Electroless Ni-P UBM and Screen-printing bump process are used broadly for the benefit of low cost process. Currently, there are a number of legislations that intended to ban Pb use. Then there are many studies of Pb-free solders that alternate thoroughly with eutectic Pb/Sn. The most common Pb-free solder alloys are based on the Sn-rich alloy with alloying elements of Bi, Cu, and Ag. In this study, interfacial reactions between electroless Ni-P UBM and Sn3.5Ag, Sn3.5Ag4.8Bi, and Sn58Bi were investigated, focusing on identification of IMC phases and IMC growth kinetics with Bi contents. These three type solders have respectively the Bi contents of 0wt%, 4.8wt% and 58wt%. As well, bump shear were investigated, focus on bump shear strength and failure modes with Bi contents. IMCs contained Bi were not observed at interface and in the bulk of solders during reflow and aging. By the way, $Ni_3Sn_4$ IMC phase were observed in the bulk of Sn3.5Ag4.8Bi solders during reflow. However, $Ni_3Sn_4$ IMCs were not observed in the bulk of Sn3.5Ag(contained 0wt% Bi) or Sn58Bi(contained 58wt% Bi). Interfacial reaction rates of each solder increased in the order of SnAg(≒SnAgBi) and SnBi during reflow. On the other hand, $(Au, Ni)Sn_4$ IMC phase were observed in the bulk of Sn3.5Ag4.8Bi solders during aging. Interfacial reaction rates of each solder increased in the order of SnBi and SnAg(≒SnAgBi) during aging. These results will be discussed in the view of Bi contents. Bump shear strength of each solder increased in the order of Sn3.5Ag4.8Bi, Sn58Bi, and Sn3.5Ag after reflow. On the other hand, bump shear strength of each solder increased in the order of SnAgBi, SnAg, and SnBi after aging Shear failures arose inside solder bumps in case of Sn3.5Ag, but at interfaces between solder and IMCs in case of Sn3.5Ag4.8Bi and Sn58Bi after reflow and aging. These differences of shear strength and shear modes will be discussed in the view of Bi contents and heat treatment.

서지기타정보

서지기타정보
청구기호 {MAME 04029
형태사항 vii, 87 p. : 삽화 ; 26 cm
언어 한국어
일반주기 저자명의 영문표기 : Moon-Gi Cho
지도교수의 한글표기 : 백경욱
지도교수의 영어표기 : Kyung-Wook Paik
학과명칭변경 : 재료공학과가 신소재공학과로 변경됨
학위논문 학위논문(석사) - 한국과학기술원 : 신소재공학과,
서지주기 참고문헌 : p. 85-87
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