서지주요정보
가속 시험과 다구치 방법을 활용한 신뢰성 설계 방법의 개발 = Development of reliability design methodologies using accelerated testing and taguchi method
서명 / 저자 가속 시험과 다구치 방법을 활용한 신뢰성 설계 방법의 개발 = Development of reliability design methodologies using accelerated testing and taguchi method / 김민.
발행사항 [대전 : 한국과학기술원, 2002].
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등록번호

8012853

소장위치/청구기호

학술문화관(문화관) 보존서고

MIE 02006

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반납예정일

등록번호

9008898

소장위치/청구기호

서울 학위논문 서가

MIE 02006 c. 2

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초록정보

The inherent reliability of product is primarily determined in the design stage, and therefore, design engineers are required to be able to design reliability into the product in an efficient manner. Especially, the product should be designed such that its reliability is robust to various noise factors encountered in production and field environments. The Taguchi method can be effectively used for this purpose. However, there exist only a few attempts to integrate the Taguchi method with reliability design, and in addition, the existing works do not sufficiently consider the robustness and/or the distinction between noise and acceleration factors. This thesis develops a unified approach to robust reliability design for the cases of accelerated life and degradation tests. First, an experimental structure for assigning not only acceleration but also noise factors is presented. Second, an optimal setting of design parameters is determined based on the reliabilities at the use condition, which are estimated using the results from accelerated conditions. Third, reliabilities are transformed into `efforts' using an effort function which reflects the degree of difficulty involved in improving the reliability. Finally, an optimal setting of design parameters is determined based on the mean and standard deviation of effort values. In addition, the flexibility and effectiveness of the proposed approach are illustrated with examples.

서지기타정보

서지기타정보
청구기호 {MIE 02006
형태사항 vi, 77 p. : 삽화 ; 26 cm
언어 한국어
일반주기 저자명의 영문표기 : Min Kim
지도교수의 한글표기 : 염봉진
지도교수의 영문표기 : Bong-Jin Yum
학위논문 학위논문(석사) - 한국과학기술원 : 산업공학과,
서지주기 참고문헌 : p. 74-77
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