This thesis is concerned with the optimal design of life-test sampling plans based on accelerated life tests (ALTs) for products with Weibull lifetime distribution. It is assumed that the scale and shape parameters are log linear functions of (possibly transformed) stress. Two levels of stress higher than the use condition stress, high and low, are used. Three types of ALT sampling plans are considered; failure-censored, time-censored, and failure-censored under equal expected test time constraint. Optimum ALT sampling plans which satisfy the producer's and consumer's risk requirements and minimize the asymptotic variance of the test statistic for deciding the lot acceptability, are obtained. The properties of the proposed ALT sampling plans and the effects of errors in pre-estimate of the design parameters are investigated. These plans with nonconstant shape parameter are compared with the existing ALT sampling plans with constant shape parameter.
