서지주요정보
푸리에 변환을 이용한 결함검사 알고리즘에 관한 연구 = A study on visual defect detection algorithm using fourier transform
서명 / 저자 푸리에 변환을 이용한 결함검사 알고리즘에 관한 연구 = A study on visual defect detection algorithm using fourier transform / 이준석.
발행사항 [대전 : 한국과학기술원, 1996].
Online Access 원문보기 원문인쇄

소장정보

등록번호

8006113

소장위치/청구기호

학술문화관(문화관) 보존서고

MME 96062

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이용가능(대출불가)

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초록정보

A defect detection algorithm using Fourier transform and sampling method which can be easily organized in factory automation system is presented. On-line production of Fourier transformed image and sampled feature values are possible with highly coherent light source, proper optical components and photo detector. In this method, the quantity of data compared with that of conventional methods will be apparently reduced. Therefore data handling will be easy and processing time will be shortened. In this paper, statistical method is used to detect defections. The newly proposed method using standard correlation coefficient(SCC) is compared with the method using Euclidean distance(ED). The objects which are selected to test are easily applied in factory automation system. And those objects have defects such as missed labels, distorted labels and differences of textural structure. The results of this test are good. But, the method using SCC is easier than the method using ED for the decision of threshold in pretreatment. Consequently, this approach appears robust, flexible and suitable for a wide range of inspection tasks.

서지기타정보

서지기타정보
청구기호 {MME 96062
형태사항 vii, 38 p. : 삽화 ; 26 cm
언어 한국어
일반주기 저자명의 영문표기 : Jun-Sok Lee
지도교수의 한글표기 : 김수현
지도교수의 영문표기 : Soo-Hyun Kim
학위논문 학위논문(석사) - 한국과학기술원 : 기계공학과,
서지주기 참고문헌 : p. 37-38
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