A defect detection algorithm using Fourier transform and sampling method which can be easily organized in factory automation system is presented. On-line production of Fourier transformed image and sampled feature values are possible with highly coherent light source, proper optical components and photo detector. In this method, the quantity of data compared with that of conventional methods will be apparently reduced. Therefore data handling will be easy and processing time will be shortened. In this paper, statistical method is used to detect defections. The newly proposed method using standard correlation coefficient(SCC) is compared with the method using Euclidean distance(ED). The objects which are selected to test are easily applied in factory automation system. And those objects have defects such as missed labels, distorted labels and differences of textural structure. The results of this test are good. But, the method using SCC is easier than the method using ED for the decision of threshold in pretreatment. Consequently, this approach appears robust, flexible and suitable for a wide range of inspection tasks.