서지주요정보
국부 주파수 분석에 의한 랜덤한 무늬 영상에서의 영역 판별 = Region identification in random-textured images by local frequency analysis
서명 / 저자 국부 주파수 분석에 의한 랜덤한 무늬 영상에서의 영역 판별 = Region identification in random-textured images by local frequency analysis / 김상원.
발행사항 [대전 : 한국과학기술원, 1994].
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8004879

소장위치/청구기호

학술문화관(문화관) 보존서고

MAD 94004

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Automatic visual inspection capability has become an important key component in the automated manufacturing system. The most conventional sensor for visual inspection is CCD camera which provides an intensity/color image of a scene. One of the challenging tasks in visual inspection using CCD camera is to identify surface defects in an image with complex textured background. In microscopic view, the surface of real objects often shows regular or random textured pattern. This paper presents a region identification method to extract surface defects in an image with textured background by using the space and frequency information at the same time. Dominant Frequency Map (DFM) is proposed to describe the frequency characteristics of every local region in an image coordinate. The method using DFM information is verified through a series of simulation and a real experiments. As a real application, defect inspection of a 14" TV CRT mold is performed. This method successfuly identifies infinitesimal surface defects, whose size is larger than 50㎛, of the mold. Also, a neural network algorithm is applied to the high-level recognition of the surface regions. The experimental results show that the DFM-based approach is less sensitive to the environmental changes, such as illumination and defocusing, than conventional vision techniques.

서지기타정보

서지기타정보
청구기호 {MAD 94004
형태사항 ii, 84 p. : 삽화 ; 26 cm
언어 한국어
일반주기 부록 수록
저자명의 영문표기 : Sang-Won Kim
지도교수의 한글표기 : 권인소
지도교수의 영문표기 : In-So Kweon
학위논문 학위논문(석사) - 한국과학기술원 : 자동화및설계공학과,
서지주기 참고문헌 : p. 78-79
주제 Pattern perception.
Factory inspection.
Neural networks (Computer science)
Manyfactures --Defects.
Image processing.
화상 처리. --과학기술용어시소러스
신경 회로망. --과학기술용어시소러스
주파수 해석. --과학기술용어시소러스
결함 검사. --과학기술용어시소러스
자동 검사 시스템. --과학기술용어시소러스
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