Undoped and aluminum-doped zinc oxide thin films were prepared on SLG(soda lime glass) by an inexpensive pyrosol technique. The films have been characterized for their structural, optical and electrical properties. X-ray diffraction analysis showed that the deposited material was pure zinc oxide with hexagonal wurzite structure. Optical absorption spectra show high transparency of the film(∼80% specular transmittance) in the visible range with a sharp absorption edge around 360nm wavelength of light which closely corresponds to the optical energy bandgap of ZnO:Al(3.33eV). Carrier concentration and mobility values were determined by measuring the Hall voltage at the room temperature. ZnO:Al thin films show low resistivity($3\times10^{-3}\Omegacm$), high transmittance(80 %) with Al/Zn=2 at %.
