complex dielectric constant and magnetic permeability may be obtained by measuring the reflection and the transmission coefficients of the material sample inserted in the waveguide. Two coaxial-to-waveguide adapters and the sample holder in-between are used. The coaxial-to-waveguide adapters are characterized through the de-embedding process using the measurements of delay line and thru line. Teflon and Polyethylene are measured and their relative permittivities and permeabilities in the X-band are found to be ε=2.08+j0.0003, μ=1.0, and ε=2.25+j0.005, μ=1.0, respectively. Real values of these constants are well within 5 percent of the reference values but their imaginary values are quite off the reference values since they are very small.
