서지주요정보
Seed grain 소결 공정이 ZnO varistor 의 미세구조와 전기적 특성에 미치는 영향 = Effect of seed grain sintering process on the microstructure and electrical properties of ZnO varistor
서명 / 저자 Seed grain 소결 공정이 ZnO varistor 의 미세구조와 전기적 특성에 미치는 영향 = Effect of seed grain sintering process on the microstructure and electrical properties of ZnO varistor / 강을손.
발행사항 [서울 : 한국과학기술원, 1986].
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소장정보

등록번호

4103635

소장위치/청구기호

학술문화관(문화관) 보존서고

MMS 8601

휴대폰 전송

도서상태

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초록정보

The low-voltage varistor was made by seed grain method at various sintering conditions such as sintering time and sintering temperature. The microstructure and electrical properties were investigated and compared with those of the varistor made by conventional method. The added seed grain rapidly grew to be a giant grain, which gave easy path to current flow. Therefore the breakdown voltage was lowered as much as the order of 1/10-1/5 in comparison to that of the varistor made by conventional method. But the size of the giant grain was little influenced by sintering condition, so the breakdown voltage was little changed. The weight loss was decreased by the addition of the seed grain, because the giant grain decreased the evaporation area. Therefore the nonohmic property of the varistor made by seed grain method was little influenced by sintering condition. In this experiment the low-voltage varistor made by seed grain method showed the least leakage current when sintered at 1150℃ for zero hour.

서지기타정보

서지기타정보
청구기호 {MMS 8601
형태사항 ii, 37 p. : 삽화 ; 26 cm
언어 한국어
일반주기 저자명의 영문표기 : Eul-Son Kang
지도교수의 한글표기 : 김종희
공동교수의 한글표기 : 오명환
지도교수의 영문표기 : Chong-Hee Kim
공동교수의 영문표기 : Myung-Hwan Oh
학위논문 학위논문(석사) - 한국과학기술원 : 재료공학과,
서지주기 참고문헌 : p. 36-37
주제 Sintering.
Microstructure.
Breakdown voltage.
Time oxide.
소결. --과학기술용어시소러스
미세 구조. --과학기술용어시소러스
전기적 성질. --과학기술용어시소러스
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