서지주요정보
극자외선 마이크로 리소그라피를 위한 4-반사경 광학계의 수차해석 = Aberration analysis of 4-mirror optical system for deep UV micro-lithoreaphy
서명 / 저자 극자외선 마이크로 리소그라피를 위한 4-반사경 광학계의 수차해석 = Aberration analysis of 4-mirror optical system for deep UV micro-lithoreaphy / 김종태.
발행사항 [대전 : 한국과학기술원, 1993].
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8003232

소장위치/청구기호

학술문화관(문화관) 보존서고

DPH 93002

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초록정보

A design of rotationally symmetric four-mirror optical system with reduction magnification 5 x for deep UV (KrF excimer laser, λ-248 nm) submicron lithography is developed. Initially it is attempted the system to be composed entirely of spherical mirrors, and the analytic solutions of the system is found, which is free from the third order spherical aberration, coma, astigmatism and distortion are obtained. However, the systems obtained are turned out to have sizable amount of residual aberrations which limit the numerical aperture to 0.2, and therefore is not useful in the submicron lithography. To overcome these shortcomings, we have attempted to introduce the non-spherical system. It is known that the axial and higher order aberrations may be controled by using the aspherical surfaces. As the first step, we have designed the four-spherical-mirror system free from the four off-axial Seidel first order aberrations that are coma, astigmatism, field curvature and distortion. In the next step, the aspherical surfaces are introduced to the tertiary and quaternary mirrors, and then the optimization of the system is carried out by using a simple damped least squares method. The optimized system shows improved performances, in other words, axial and higher order aberrations are significantly reduced as expected. The numerical aperture of this system is 0.38 and field angle is 3˚. The new type of the aspherized 4-mirror system, which is t < 0 ($t=\Sigma{d_i},{d_i}$ is the distance from i-th mirror to (i+1)-th mirror), is proposed. It is a reflection system useful for submicron lithographic applications. The numerical aperture of this system is as large as 0.40, which gives Rayleigh resolution of 0.38 ㎛.

서지기타정보

서지기타정보
청구기호 {DPH 93002
형태사항 iv, 73 p. : 삽화 ; 26 cm
언어 한국어
일반주기 저자명의 영문표기 : Jong-Tae Kim
지도교수의 한글표기 : 공홍진
공동교수의 한글표기 : 이상수
지도교수의 영문표기 : Hong-Jin Kong
공동교수의 영문표기 : Sang-Soo Lee
학위논문 학위논문(박사) - 한국과학기술원 : 물리학과,
서지주기 참고문헌 : p. 70-73
주제 수차 (광학). --과학기술용어시소러스
리소그래피. --과학기술용어시소러스
자외선. --과학기술용어시소러스
반사경. --과학기술용어시소러스
Mirrors.
Aberration.
Lithography.
Ultraviolet radiation.
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